THE ELECTRON-SPECTROSCOPIC INVESTIGATIONS OF THE EPITAXIAL CoSi2 FILMS ON SILICON

Authors

  • B. E. Egamberdiev
  • H. H. Mamirov Institute of Military Aviation of the Republic of Uzbekistan

Keywords:

Silicon, epitaxial, structure, vacuum, electron, zone, temperature, spectroscopy, CoSi2, molecular beam epitaxy method, electron-spectroscopic, silicid, peaks, spectra, films.

Abstract

This work is devoted to the study of the electronic structure

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Published

2025-04-04

Issue

Vol. 6 No. 4 (2025): wos

Section

Articles

License

Copyright (c) 2025 Web of Scientist: International Scientific Research Journal

Creative Commons License

This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.