YA. A. SAIDIMOV; F. B. UMAROV. INVESTIGATION OF SILICON SAMPLES DOPED WITH TERBIUM AND THULIUM. Web of Scientist: International Scientific Research Journal, [S. l.], v. 5, n. 9, p. 78–82, 2024. Disponível em: https://wos.academiascience.org/index.php/wos/article/view/5042. Acesso em: 29 nov. 2024.